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M. Żenkiewicz, J. Gołębiewski

Photoelectron spectroscopy as applied to study the depth profile of polypropylene film

Polimery 1999, No 4, 246

DOI: dx.doi.org/10.14314/polimery.1999.246


The physical fundamentals of photoelectron spectroscopy are reviewed and the range of applications is given. The features described include the relationship between electron bonding energy and chemical shift, results of testing the depth profile in the activated external layer of the PP surface, the arrangement of the spectrophotometer and its major subassemblies and the importance of vacuum to be maintained in the instrument during a test. Three PP films were examined and the depth of oxidation was found to be in the nanometer range (Table 5). The oxidation level of the external layer increases as the specific energy of corona discharges is increased, e.g., at 75 000 J/m2, oxidation is 20 % (Fig. 8). The present results are consistent with those obtained by the calculation methods described in [25] and [26].
Keywords: photoelectron spectroscopy, physical background, activated polypropylene film, level of oxidation of the surface layer

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