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H. Kaczmarek, R. Czajka, M. Nowicki, D. Ołdak

Polymer studies using atomic force microscopy (AFM). Part I. Principles of AFM and its application in polymer morphology investigations

Polimery 2002, No 11-12, 775


Summary

On the basis of recent literature data the principles of Atomic Force Microscopy (AFM) and progress in the development of this technique have been reported. Its advantages and shortcomings as well as the possibilities it creates have also been discussed. Application of AFM method for geometric structure of polymer surface determining as well as determining of surface roughness and morphology of polymer blends and copolymers. AFM is especially useful for investigation of the surface defects, impurities, wettability, polymer miscibility, phase separation, selforganized structures and moleeular interactions. Owing to AFM the influence ot polymer surface morphology on the polymer properties (in nanometer scale) can be estimated.


Keywords: Atomic Force Microscopy (AFM), nanostructures, geometric structure of polymer surface, roughness, polymer blends, morphology, copolymer structure

H. Kaczmarek, R. Czajka, M. Nowicki, D. Ołdak (1.41 MB)
Polymer studies using atomic force microscopy (AFM). Part I. Principles of AFM and its application in polymer morphology investigations