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M. Żenkiewicz


The applications of atom force microscopy in polymer studies


Polimery 1999, No 9, 571


DOI: dx.doi.org/10.14314/polimery.1999.571


Summary

Principal operating parameters are described for the operation of the atomic force microscope (AFM); they include measuring tip-specimen interactions, measuring cantillever elasticity constant, measuring tip-specimen contact surface area, operation mode, etc. Reported surface roughness studies are reviewed for polymers and plastics including surface roughness variations caused by corona discharges. AFM applications to study the molecular and supramolecular structures of polymers and molecular interactions are described. Results are reviewed of the studies on surface homogeneity and unformity of surface layers in polymers, on thin membrane thickness measurements, mechanisms of permeability of thin polymer films, evaluation of fiber modification effects, and on preparation of elements of adhesive joints.


Keywords: operation of atom force microscope, atomic forces, molecular and supramolecular polymer structures, thin polymer films, surface homogenity and uniformity of surface polymer layers, evaluation of surface roughness

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