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M. Żenkiewicz, J. Polanski


The principles of atomic force microscopy in polymer studies


Polimery 1999, No 7-8, 520


DOI: dx.doi.org/10.14314/polimery.1999.520


Summary

A general scope of applications and research possibilities is presented for the atomic force microscope (AFM). Construction of fundamental subassemblies, viz., lever and measuring edge, lever deflection measuring system, scanner, feedback system, computerized image generator, is described. Interaction types (van der Waals, electrostatic, magnetic, capillary and short-range repulsion forces) are presented and methods of their AFM studies are presented. The major and combined AFM operation systems are described and major applications emphasized. Research limitations and major error sources are indicated (external vibrations, temperature dilatation or shrinkage of construction details).


Keywords: atomic force microscope (AFM), design, types of interactions examined, work system, applications, research limitations, error sources


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