XPS studies of polymers (English version)
X-ray photoelectron spectroscopy (XPS) is used in many fields of solid and surface chemistry. XPS uses X-ray irradiation of solid samples and consists in measuring the kinetic energies of the emitted photoelectrons in order to provide elemental and chemical characterization of surfaces. The conditions of analysis and sample preparation were discussed. The depth of analysis is of the order of 5 to 10 nm whereas the spatial resolution of XPS enables analysis of small areas with diameters in the 150 to 250 pm range. XPS chemical imaging with a resolution inthe 10—30 pm range is now available. A review of the results obtained with XPS studies of polymer surfaces and interfaces was presented, a.o. in the evaluation of surface contamination, chemical surface treatments, and crystallinity. Interesting results were obtained in the studies of conductive polymers, metal—polymer interfaces (e.g., A1—polyimide, Cr—polyimide) and inthe studies of polymer adhesion.
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